


IEC 62368-1 Figure V.2 Jointed Test Probe
The IEC 62368-1 Figure V.2 Jointed Test Probe is engineered to simulate adult finger access and verify that hazardous parts in AV/IT equipment are not reachable, ensuring compliance with accessibility safety requirements of IEC 62368-1. With articulated joints at 14° and 37° for realistic movement, this probe accurately tests openings and safeguards in televisions, monitors, servers, routers, amplifiers, and battery-powered devices.
- MOQ: 1
Standard Packaging: plywood box
Delivery Period: 40 working days
Payment Method: T/T
Supply Capacity: 10 units per month
IEC 62368-1 Figure V.2 Jointed Test Probe Description
IEC 62368-1 Figure V.2 Jointed Test Probe is a precision accessibility test tool engineered to simulate adult human finger access and verify that hazardous parts in audio/video, information, and communication technology equipment are protected against unintended contact. With articulated joints at 14° and 37° (±15′ tolerance) for realistic movement simulation, this probe accurately evaluates openings, enclosures, and safeguards in televisions, monitors, servers, routers, amplifiers, battery-powered portable devices, and other AV/IT products—ensuring compliance with the hazard-based safety requirements of IEC 62368-1 (including clauses V.1.2, 5.3.2, 8.5.4.3 and Annex V).
Derived directly from IEC 61032:1997 Figure 2 (Test Probe B), the probe supports repeatable, certification-grade testing for global safety marks such as CE, UL, CB Scheme, and CCC, helping manufacturers identify accessibility risks early, reduce field failures, and achieve faster market compliance.
Product Features
- Exact compliance with IEC 62368-1 Figure V.2 — Direct reference for adult finger accessibility simulation (derived from IEC 61032 Figure 2 Test Probe B).
- Articulated joint design — Joints at 14° and 37° (±15′ tolerance) for realistic human finger reach and movement simulation.
- Robust construction — Stainless steel knurled finger + nylon handle and baffle plate for long-term durability and corrosion resistance in repeated lab testing.
- Precise dimensions — Knurled finger Ø12 mm × 80 mm; baffle plate Ø50 mm × 100 mm × 20 mm thick.
- Tight manufacturing tolerances — Radii ±0.1 mm; linear dimensions ≤15 mm: 0/-0.1 mm, >15–25 mm: ±0.1 mm, >25 mm: ±0.3 mm.
- Natural probing force — Total weight 1.0 kg for consistent and repeatable application without additional tools.
- Versatile application — Supports Clause V.1.2, 5.3.2, 8.5.4.3 and Annex V accessibility/hazard checks in full test kits.
- User-friendly handling — Ergonomic nylon grip and knurled finger surface for precise, comfortable operation in certification labs.
Key Highlights & Advantages
- Superior Accuracy & Repeatability — Strict tolerances and realistic joint angles ensure certification-grade results with minimal variation, outperforming generic or low-precision probes.
- High Durability & Longevity — Premium stainless steel finger and nylon components offer exceptional wear resistance and stability compared to traditional or budget alternatives.
- Certification-Ready Performance — Built-in compliance with IEC 62368-1 Figure V.2 and IEC 61032 Figure 2 Test Probe B simplifies setup and guarantees repeatable, regulation-ready outcomes.
- Factory Direct Efficiency — MOQ 1 unit, in-stock availability, fast global shipping, 1-year warranty, and lifetime technical support reduce procurement time and costs.
- One-Stop Compatibility — Seamlessly integrates with other IEC 62368-1 Annex V probes (e.g., Figure V.1 unjointed, V.3 blunt) for complete accessibility test kits, ideal for R&D, QA, third-party labs, and regulatory registration.
IEC 62368-1 Figure V.2 Jointed Test Probe Technical
| Parameter | Specification |
|---|---|
| Model Number | IEC62368-1-Figure V.2 |
| Material | Nylon + Stainless Steel |
| Total Weight | 1.0 kg |
| Knurled Finger Diameter | 12 mm |
| Knurled Finger Length | 80 mm |
| Baffle Plate Diameter | 50 mm |
| Baffle Plate Length | 100 mm |
| Baffle Plate Thickness | 20 mm |
| Joint Angles | 14° and 37° (±15′ tolerance) |
| Radius Tolerances | ±0.1 mm |
| Linear Dimension Tolerances | ≤15 mm: 0/-0.1 mm; >15-25 mm: ±0.1 mm; >25 mm: ±0.3 mm |
| Certifications | ISO9001, CE |
| MOQ | 1 unit |
| Supply Capacity | 100 sets/month |
| Warranty | 1 year |
| Packaging | Safety carton or plywood box |
| Delivery | Goods in stock, fast shipping |
| Payment | T/T |
| Origin | China (KingPo manufacturer) |
Get Free Quote for IEC 62368-1 Figure V.2 Jointed Test Probe
We deliver the premium IEC 62368-1 Figure V.2 Jointed Test Probe directly from KingPo factory, providing precise tools for hazard-based accessibility compliance in AV/IT equipment.
The Core Value We Deliver to You
- Standard-Exact Compliance – Manufactured to IEC 62368-1 Figure V.2 with precise tolerances for reliable certification outcomes
- High Durability & Realism – Stainless steel finger + nylon handle for consistent, long-term performance in lab testing
- Factory Advantages – MOQ 1 unit, ready stock, fast global shipping, 1-year warranty, ISO9001 & CE certified
- Complete Testing Support – Integrate with our full IEC 62368-1 probe series (V.1, V.3, etc.) to streamline your procurement
- Accelerate Market Entry – Detect accessibility risks early, minimize recalls, and enhance product safety reputation
Take Action Now – Fill out the inquiry form in 30 seconds—we’ll respond within 24 hours with our best factory price, stock update, and customized technical proposal!
IEC 62368-1 Figure V.2 Jointed Test Probe Applications
- Audio/Video Equipment – Tests TVs, monitors, projectors, speakers, and amplifiers for finger-accessible hazardous parts
- Information Technology Devices – Verifies servers, routers, laptops, tablets, and peripherals meet IEC 62368-1 accessibility safeguards
- Communication & Battery-Powered Products – Ensures portable AV/IT gear and battery-integrated devices prevent unintended contact
- Certification & Testing Labs – Used by third-party bodies and QA departments for repeatable IEC 62368-1 compliance (Annex V probes)
- Global Safety Certifications – Supports CE, UL, CB Scheme, CCC by confirming no electric shock/mechanical hazards via adult finger simulation
- Related Testing Scenarios – Often paired with other Annex V probes (Figure V.1 unjointed, V.3 blunt) for full accessibility evaluation kits
IEC 62368-1 Figure V.2 Jointed Test Probe
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