IEC 61032 Test Probe B – IP2X Jointed Test Finger
The IEC 61032 Test Probe B is a jointed test finger designed for finger-accessibility and hazardous-part access testing through enclosure openings. It is suitable for electrical safety laboratories, certification testing and IP2X-related evaluation.
- Test purpose: Evaluates whether a finger-type access probe can reach hazardous parts through enclosure openings
- Main standard references: IEC 61032 and IEC 60529, with applicable use in IEC 60335-1 safety testing
- Probe concept: Two-joint articulated finger for simulating human finger access
- Laboratory use: Supports 10 N force application verified by a force gauge and external electrical contact indication
- Typical users: Third-party laboratories, certification organizations, appliance manufacturers and electrical product safety teams
- Documentation support: Calibration or dimensional inspection documentation can be provided according to confirmed project requirements
Product Overview
The IEC 61032 Test Probe B is intended for standards-based accessibility testing where laboratories need to determine whether a person could reach a live or otherwise hazardous part through an opening in an enclosure.
The test is not simply an opening-size check. The articulated finger can be introduced into accessible slots, apertures or enclosure openings and positioned during the evaluation to investigate possible access around guards, barriers and internal enclosure structures.
The probe uses a stainless steel jointed finger with two articulated joints, combined with a guard and polyamide handle. Its structure is intended to reproduce the geometry and movement of a standardized finger-type access probe.
For laboratory and certification applications, probe geometry, joint movement, applied test force and contact indication setup are important parts of the test arrangement. The applicable standard edition and test clause should therefore be confirmed before testing or quotation.
Technical Specifications
Key specifications of the IEC 61032 Test Probe B for laboratory and purchasing review.
| Item | Specification |
|---|---|
| Product Type | Jointed test finger / Test Probe B |
| Primary Standard Reference | IEC 61032 |
| Enclosure Test Reference | IEC 60529 |
| Typical Safety Application | IEC 60335-1, where the applicable requirement specifies Test Probe B |
| Main Test Purpose | Verification of accessibility to hazardous parts |
| Probe Structure | Two-joint articulated finger |
| Reference Finger Diameter | Ø12 mm |
| Reference Articulated Finger Length | 80 mm |
| Probe Material | Stainless steel |
| Handle Material | Polyamide |
| Surface Finish | Chrome plating |
| Applied Test Force | 10 N |
| Force Application / Verification | Force gauge |
| Electrical Connection | For external contact indication circuit |
| Built-in Indication Unit | Not included |
| Documentation | Calibration or dimensional inspection documentation available according to confirmed requirements |
Final documentation scope and dimensional verification requirements should be confirmed before quotation.
Standards and Test Purpose
|
PRIMARY STANDARD
IEC 61032 Test Probe BIEC 61032 defines test probes used to verify the protection provided by enclosures, including protection of persons against access to hazardous parts. The IEC 61032 Test Probe B is an articulated finger-type probe for finger-accessibility evaluation. |
IP APPLICATION
IEC 60529 and IP2X EvaluationThe IEC 61032 Test Probe B is commonly used for finger-accessibility evaluations associated with IP2X-related testing. The applicable IEC 60529 procedure and relevant IP classification requirements should be reviewed for each project. |
|
APPLIANCE SAFETY
IEC 60335-1 ApplicationsFor household and similar electrical appliances, the jointed test finger may be used where the applicable IEC 60335 requirement specifies an articulated access probe. The edition, relevant Part 2 standard and test clause should be confirmed. |
PROJECT REFERENCE
Additional and Legacy ReferencesThe original product specification also references IRAM 4220-1, SASO/IEC 60335-1, SASO IEC 60950 and IEC 60950 / EN 60950. For legacy projects, the exact edition and clause should be confirmed. |
Jointed Finger Design and Access Simulation
|
01
Two-Joint Articulated StructureThe two-joint structure allows the finger to change direction during accessibility evaluation where straight insertion alone cannot represent the required access condition. |
02
Standardized Finger GeometryThe probe incorporates a reference finger diameter of Ø12 mm and an articulated finger length of 80 mm, together with the joint, guard and stop-face arrangement. |
03
Guard and Insulating HandleThe stainless steel finger section provides the functional probing geometry. The guard and polyamide handle support controlled handling and separate the operator’s handling area from the conductive finger. |
An oversized, undersized or incorrectly articulated probe may create a different accessibility condition. Dimensional verification is therefore important for standards-based laboratory work.
Test Procedure and Laboratory Use
A typical laboratory workflow for the IEC 61032 Test Probe B. Final test operation should follow the applicable standard and laboratory procedure.
Test Procedure and Laboratory Use
A typical laboratory workflow for the IEC 61032 Test Probe B. Final test operation and evaluation should follow the applicable standard and laboratory procedure.
Identify the applicable standard, edition and test clause. Confirm that IEC 61032 Test Probe B is the required access probe and check the specified test force and contact detection method. |
Place the enclosure, appliance or equipment in the condition required by the applicable safety standard and laboratory test procedure. |
||||
Introduce the jointed test finger into or against the opening, slot or accessible area and position the articulated finger according to the applicable test procedure. |
For the referenced 10 N application, apply the test force using a force gauge to provide a controlled condition during the accessibility evaluation. |
||||
Verify that the required 10 N force is applied using the force gauge. Force verification provides a more consistent test condition than subjective manual pressure. The force gauge or complete force application arrangement should be confirmed during quotation. |
Use the probe connection with the laboratory’s external contact indication circuit where electrical contact detection is required.A built-in buzzer, lamp or independent indication unit is not included with the probe. The intended indication arrangement should be confirmed before testing. |
Test Setup Note:
The applicable standard edition, test clause, required force and contact indication method should be confirmed before the test. The probe does not contain a built-in fixed-force mechanism or indication device.
Typical Test Objects and Applications
The IEC 61032 Test Probe B is used for enclosure accessibility and electrical safety evaluations where an articulated finger probe is specified.
|
Household appliances
|
Electrical enclosures
|
Control equipment
|
Ventilation openings
|
|
Enclosure apertures
|
Protective guards
|
Accessible gaps
|
Electrical assemblies
|
|
LAB
Testing and Certification LaboratoriesSuitable for standards-based accessibility testing where laboratories need controlled probe geometry, articulated movement, force application and technical documentation. |
MANUFACTURER
Manufacturer Compliance LaboratoriesUsed during product development, enclosure design verification, pre-compliance testing, internal safety evaluation and quality investigation. |
R&D
Product Safety and R&DSupports evaluation of ventilation openings, internal barriers, protective covers and guard arrangements where Test Probe B is specified. |
Laboratory Configuration Notes
Correct probe selection should be based on the applicable test requirement. Before ordering an IEC 61032 Test Probe B, review the following project information.
01 Standard and ClauseProvide the applicable standard number, edition and test clause. For IEC 60335 projects, identify the applicable Part 2 standard where relevant. |
02 Test SampleProvide the product type, enclosure information, opening location and sample photographs, especially for unusual guard or enclosure structures. |
03 Force GaugeConfirm whether the laboratory already has a suitable force gauge or requires force application equipment to be reviewed with the probe. |
04 Contact IndicationThe probe includes a connection for an external contact indication circuit. A buzzer, lamp or independent indication unit is not included. |
Compliance & Regulatory Assurance
- The IEC 61032 Test Probe B supports accessibility testing related to IEC 61032, IEC 60529 and applicable IEC 60335-1 requirements. It is intended for standards-based verification of protection against access to hazardous parts in laboratory, certification and manufacturer compliance testing.
- To support compliance work, the applicable standard edition, test clause, required force and contact indication method should be confirmed before ordering. Calibration or dimensional inspection documentation can be provided according to confirmed laboratory and project requirements.
|
IEC 61032 Test Probe B Product Catalogue
Product catalogue covering the IEC 61032 Test Probe B, IP2X jointed test finger design, 10 N force application and household appliance accessibility testing.
|
Download PDF |
Technical Inquiry & Expert Support
For accurate IEC 61032 Test Probe B selection, please share the following test information when sending an inquiry. This helps confirm the applicable probe requirement, force setup and documentation needs before quotation or supply.
| Information Needed | Example |
|---|---|
| Applicable standard | IEC 61032 / IEC 60529 / applicable IEC 60335 requirement |
| Standard edition and clause | Applicable edition and specific accessibility test clause |
| Test object | Appliance, electrical enclosure, protective guard or equipment housing |
| Force gauge requirement | Probe only / force gauge or force application arrangement required |
| Contact indication setup | Existing external indication circuit or laboratory contact detection method |
| Documentation needs | Calibration document, dimensional inspection record or project-specific technical documentation |
KINGPO can review the applicable standard, probe application, force requirement and documentation scope before quotation. This helps reduce probe selection or configuration errors and supports laboratory, certification and manufacturer compliance testing.
Detail Display
